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Atomic force microscopy and optical characterization of PbS quantum dots grown in glass matrix
Affiliation:1. Department of Applied Physics, Institute of Advanced Materials Physics, Tianjin Key Laboratory of Low Dimensional Materials Physics and Preparing Technology, Faculty of Science, Tianjin University, Tianjin 300072, People’s Republic of China;2. Department of Physics, Tianjin Normal University, Tianjin 300387, People’s Republic of China;3. Tianjin Key Laboratory of Film Electronic & Communicate Devices, School of Electronics Information Engineering, Tianjin University of Technology, Tianjin 300384, People’s Republic of China;1. CIDS, Benemérita Universidad Autónoma de Puebla, Ciudad Universitaria, Av. San Claudio y 18 Sur, Col. San Manuel, Puebla, Pue, Mexico;2. Lab. Mat. Sci. Facultad de Ciencias Químicas, Universidad Autónoma de Puebla, Pue., P.O. Box 1067, C.P. 72001, Mexico;3. Instituto de Física, UNAM, Ciudad Universitaria, Circuito de la Investigación s/n, 04510 Coyoacán, México, D.F., Mexico;4. Centro de Vinculación Universitaria, Universidad Autónoma de Puebla, P.O. Box 1067, 72001 Puebla, Mexico;1. State Key Laboratory on Integrated Optoelectronics, Jilin University, 2699 Qianjin Street, Changchun 130012, China;2. College of Electronic Science and Engineering, Jilin University, 2699 Qianjin Street, Changchun 130012, China;3. Institute of Semiconductors, Chinese Academy of Sciences, No A35 QingHua East Road, Beijing 100083, China
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