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Integrated a‐Si TFT row driver circuits for high‐resolution applications
Authors:Cheon‐Hong Kim  Se‐Jong Yoo  Hyun‐Jin Kim  Jung‐Mok Jun  Jung‐Yeal Lee
Abstract:Abstract— A 12.1‐in. tablet liquid‐crystal‐display (LCD) panel with integrated amorphous‐silicon row driver circuits has been developed using a standard TFT process and Advanced Fringe‐Field Switching (AFFS) technology. An XGA‐resolution 768‐stage shift‐register circuit with two‐phase clocks has been designed and fabricated. The circuit parameters were optimized in order to obtain a highly reliable a‐Si row‐driver‐circuit structure. Thermal Humidity Operation (THO) test results at 50°C and 80% humidity during 500 hours of operation shows that the fabricated panel is reliable during long‐term operation and any abnormal display phenomenon was not observed at 0°C.
Keywords:a‐Si TFT  row driver  shift register  reliability  advanced FFS
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