萃取方法对樟树叶萃取效果的XPS表征

以樟树叶为研究对象,通过超临界萃取和微波萃取两种方法对其进行处理并采用X射线光电子能谱仪(XPS)对处理后的樟树叶残渣表面化学组成和结构变化进行表征,以期对提取效果进行预测。结果表明,处理前后的樟树叶表面主要由C、O、N、Si等元素组成。通过对C1s进行曲线拟合与分峰发现,处理前后的樟树叶中的C1s存在三种形态:C1、C2、C3。C1的相对含量的变化为:微波萃取后的樟树叶<超临界萃取后的樟树叶;C2、C3的相对含量变化规律与C1正相反。对于处理前后樟树叶表面O1s拟合分峰发现其有两种结合形式:O1和O2。由于樟树叶中不仅含有C元素,还含有N、Si元素,因此,经超临界和微波两种方法处理后樟树叶中O1的含量较素材有所提高。经微波处理后的萃取液中的萜类化合物等抽提物含量高于超临界萃取;经超临界萃取的挥发油中含有抽提物的同时也含有大量的葡萄糖类化合物。可根据提取物的不同用途采用不同的处理方法。

XPS study on the influence of extract methods to Camphor Leaves

In this study,the activated composition was extracted from camphor leaves by supercritical fluid and microwave extraction.The surface chemical composition and structure of treated residue were analyzed by XPS,which can forecast the effects of extract.The results showed that the surface of camphor leaves is made up of mainly 5 elements: C,O,H,N,Si.The binding energy of C1s of the treated and untreated leaf surface was classified as 3 types: C1,C2,C3 through the mixed line Gaussian and Lorentizian.The relativ...