BILCO: built in testing method for combinational logic circuits |
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Authors: | Harvey D.M. |
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Affiliation: | Sch. of Electr. Eng., Electron. & Phys., Liverpool John Moores Univ.; |
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Abstract: | The testing of digital logic circuits has become quite complex owing to miniaturisation and its associated increase in circuit function per unit area. Methods have been devised for testing ASIC products and, latterly, board level products. A new method (BILCO) is presented for probing asynchronous combinational logic circuits using a novel development of scan path principles |
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