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A STATISTICAL APPROACH TO INSPECTION SYSTEM SELECTION |
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| Authors: | Scott A Dellana Sanjay Radhakrishnan |
| Affiliation: | a Decision Sciences Department, East Carolina University, North Carolina b Industrial Engineering Department, Pennsylvania State University, Pennsylvania |
| Abstract: | |
| Keywords: | Inspection Coordinate measuring machine (CMM) Quality control Metrology Surface plate inspection Statistics Inspection statistical comparison |
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