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MEMS packaging process by film transfer using an anti-adhesive layer
Authors:Sebastien Brault  O Garel  G Schelcher  N Isac  F Parrain  A Bosseboeuf  F Verjus  M Desgeorges and E Dufour-Gergam
Affiliation:(1) Institut d’Electronique Fondamentale, UMR CNRS 8622, Universit? Paris Sud-11, B?t.220, 91405 Orsay Cedex, France;(2) KFM Technology, 11 Avenue de Norv?ge, 91140 Villebon sur Yvette, France
Abstract:A low cost and low temperature thin film packaging process based on the transfer of an electroplated Nickel 3D cap is proposed. This process is based on adhesion control of a thick molded cap Ni film on the carrier wafer by using a plasma deposited fluorocarbon film, on mechanical debonding and on adhesive bonding of the microcaps on the host wafer with BCB sealing rings. Mechanical characterizations show that the transferred microcaps have a high stiffness, a low stress and a high adhesion. Because this process is simple and only involves a low temperature (250°C) heating of the host wafer, it is highly versatile and suitable for the encapsulation of micro and nano devices, circuits and systems elaborated on a large range of substrate materials.
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