边界扫描技术在VLSI电路设计中的应用研究

边界扫描技术（BST）是一种新型的VLSI电路测试方法，但在扫描链路的设计中如何将不同厂家、不同型号、不同工作电压的BS器件实现JTAG互连，如何将边界扫描测试、在线编程和仿真结合起来一直是一个亟待解决的问题；为解决上述问题，在大规模集成电路设计中采用逻辑可编程扫描链方法，利用边界扫描技术对电路板进行测试，实验证明采用逻辑可编程扫描链方法可有效的解决测试与在线编程（或在线仿真）的兼容问题。

Research on Designing VLSI Circuits Based on Boundary-scan Technology

Boundary-scan technology(BST) is a new method for testing VLSI circuits.When designing the boundary scan(BS) chain,we are faced with some problems requiring solution immediately,such as how to realize the JTAG interconnection among the BS devices coming from different manufactures,of different types and having different working voltages,as well as how to combine BS test,in-system-programming and in-system-emulation together.To solve these problems,the method of logic programmable BS chain is applied in the design of VLSI circuits.Some experiments are done,which prove it's an effective way to resolve the compatibility between test and in-system-programming(or in-system-emulation).