Department of Materials Science and Engineering, McMaster University, 1280 Main Street West, Hamilton, Ontario, Canada L8S 4L7
Abstract:
Cerium oxide films of thickness 0.1–300 μm were deposited on Ni substrates via cathodic electrolytic and electrophoretic deposition. The films were studied by X-ray diffraction, thermogravimetric analysis and scanning electron microscopy. Experimental results obtained by both deposition methods are compared. The influence of deposition parameters and additives on deposition yields and film morphologies is studied and discussed.