首页 | 本学科首页   官方微博 | 高级检索  
     

JY Ultima2ICP-OES光谱仪测定Ta-2.5W和Ta-10W中钨元素的分析方法研究
引用本文:郝文婷.JY Ultima2ICP-OES光谱仪测定Ta-2.5W和Ta-10W中钨元素的分析方法研究[J].材料开发与应用,2019,34(3):38-40.
作者姓名:郝文婷
作者单位:宁夏东方钽业股份有限公司,宁夏石嘴山753000;西北稀有金属材料研究院宁夏有限公司,宁夏石嘴山753000;国家钽铌特种材料工程技术研究中心,宁夏石嘴山753000
摘    要:采用发射光谱仪建立发射光谱法测定Ta-2.5W和Ta-10W中钨含量的方法。使用高纯氢氧化钽基体的纯钨标准溶液制作工作曲线,钨的分析线为209.475 nm,方法的线性范围为1.25%~15.00%,加标回收率在93.0%~99.0%之间,测定结果的RSD值(n=11)小于0.8%。

关 键 词:发射光谱法    钽钨合金

Study on the Analysis Method of Tungsten Element in Ta-2.5W and Ta-10W by JY Ultima2 CP-OES Spectrometer
HAO Wenting.Study on the Analysis Method of Tungsten Element in Ta-2.5W and Ta-10W by JY Ultima2 CP-OES Spectrometer[J].Development and Application of Materials,2019,34(3):38-40.
Authors:HAO Wenting
Affiliation:(Ningxia Orient Tantalum Industry Co., Ltd, Shizuishan 753000, China;Northwest Institute of Rare Metal Materials Ningxia Co., Ltd, Shizuishan 753000, China;National Engineering Research Center of Tantalum and Niobium Special Materials, Shizuishan 753000, China)
Abstract:A method for the determination of tungsten contents in Ta-2.5 W and Ta-10 W was established by using the emission spectrometer. The work curve was made by pure tungsten standard solution of high purity tantalum hydroxide matrix, the analytical line of tungsten was 209.475 nm, the linear range of the method was 1.25%~15.00%, the recovery rate was 93.0%~99.0%, and the relative standard deviation(n=11) of the measured values was less than 0.8%.
Keywords:emission spectroscopy  tungsten  tantalum tungsten alloy
本文献已被 维普 万方数据 等数据库收录!
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司  京ICP备09084417号