首页 | 本学科首页   官方微博 | 高级检索  
     

基于AⅧAA模型的弹上电子设备可靠性增长试验研究
引用本文:张立民,孙永威,周帆.基于AⅧAA模型的弹上电子设备可靠性增长试验研究[J].计算机与数字工程,2010,38(2):18-21,74.
作者姓名:张立民  孙永威  周帆
作者单位:1. 海军航空工程学院电子信息工程系,烟台,264001
2. 海军航空工程学院研究生管理大队,烟台,264001
3. 海军通信总站六大队技术室,北京,100071
摘    要:采用工程界普遍使用的AMSAA模型,对某型弹上电子设备进行了可靠性增长试验,达到了预期的可靠性增长目标,验证了AMSAA模型方法的合理性,并简述了一种在AMSAA模型基础上采用牛顿迭代法来预测特定MTBF下的试验时间的方法,该方法合理可行,对开展可靠性增长与可靠性增长试验工作具有重要的实际意义。

关 键 词:可靠性增长  可靠性增长试验  AMSAA模型

Research of Reliability Growth and Reliability Growth Test for Guided Missile Avionics Based on AMSAA Model
Zhang Limin Sun Yongwei Zhou Fan.Research of Reliability Growth and Reliability Growth Test for Guided Missile Avionics Based on AMSAA Model[J].Computer and Digital Engineering,2010,38(2):18-21,74.
Authors:Zhang Limin Sun Yongwei Zhou Fan
Affiliation:Department of Electronic and Information Engineering of NAEI1;Graduate Students' Brigade of NAEI2;Technology Station of 6th Brigade in Naval Communication Terminal3
Abstract:Based upon the AMSAA model which has been widely used in engineering,reliability growth tests for the guided missile avionics are done.It has achieved prospective target and testified the reasonableness of AMSAA model.The paper simply describes a method which can predict the test time at the given MTBF time.It adopts Newton iteration on the base of AMSAA model.The method is reasonable and feasible,and very important to the work of reliability growth and reliability growth test.
Keywords:reliability growth  reliability growth test  AMSAA model  
本文献已被 CNKI 维普 万方数据 等数据库收录!
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司  京ICP备09084417号