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SiC MOSFET模块结温监测研究
引用本文:李凌云,何芹芹,黄德雷. SiC MOSFET模块结温监测研究[J]. 电源学报, 2021, 19(3): 169-174
作者姓名:李凌云  何芹芹  黄德雷
作者单位:江苏省宿迁经贸高等职业技术学校, 宿迁 223600;江苏科技大学电子信息学院, 镇江 212003,江苏省宿迁经贸高等职业技术学校, 宿迁 223600,中国矿业大学电气与动力工程学院, 徐州 221116
摘    要:碳化硅金属氧化物半导体场效应管SiC MOSFET(silicon carbide metal oxide semiconductor field effect tra-nsistor)以其优异的材料特性成为一种很有前景的高功率密度和高效率器件,而结温是其设计和工作的一个重要参数,也是健康状态的重要指标.为了状态监控的...

关 键 词:结温提取  碳化硅(SiC)  金属氧化物半导体场效应管(MOSFET)  阈值电压
收稿时间:2019-03-25
修稿时间:2021-02-26

Study on Junction Temperature Monitoring of SiC MOSFET Module
LI Lingyun,HE Qinqin and HUANG Delei. Study on Junction Temperature Monitoring of SiC MOSFET Module[J]. Journal of Power Supply, 2021, 19(3): 169-174
Authors:LI Lingyun  HE Qinqin  HUANG Delei
Affiliation:Suqian Economic and Trade Higher Vocational Technical School of Jiangsu, Suqian 223600, China;School of Electronics and Information, Jiangsu University of Science and Technology, Zhenjiang 212003, China,Suqian Economic and Trade Higher Vocational Technical School of Jiangsu, Suqian 223600, China and School of Electrical and Power Engineering, China University of Mining and Technology, Xuzhou 221116, China
Abstract:Owing to its excellent material properties, silicon carbide metal oxide semiconductor field effect tra-nsistor (SiC MOSFET) is becoming a promising device with high power density and high efficiency. As an important design and operating parameter, junction temperature is also an important indicator of health status. For the purpose of state monitoring, a junction temperature extraction method based on quasi-threshold voltage was proposed in this paper, which is less affected by self-heating. First, it was theoretically and experimentally proved that the threshold voltage VTH showed a good linearity with temperature, and this relationship had a negative temperature sensitivity. Then, the effect of external drive resistor RGext on VTH was observed experimentally. Finally, the circuit for obtaining the quasi-threshold voltage was put forward in combination with the intelligent drive, and the feasibility of the proposed method was verified by experimental results.
Keywords:junction temperature extraction  silicon carbide (SiC)  metal oxide semiconductor field effect transistor (MOSFET)  threshold voltage
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