Sensitivity of peak positions to flight-path parameters in a deep-inelastic scattering neutron TOF spectrometer |
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Authors: | E.MacA. Gray C.A. Chatzidimitriou-DreismannT.P. Blach |
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Affiliation: | a Queensland Micro- and Nanotechnology Centre, Griffith University, Brisbane 4111, Australia b Institut für Chemie, Technische Universität Berlin, D-1623 Berlin, Germany |
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Abstract: | The effects of small changes in flight-path parameters (primary and secondary flight paths, detector angles), and of displacement of the sample along the beam axis away from its ideal position, are examined for an inelastic time-of-flight (TOF) neutron spectrometer, emphasising the deep-inelastic regime. The aim was to develop a rational basis for deciding what measured shifts in the positions of spectral peaks could be regarded as reliable in the light of the uncertainties in the calibrated flight-path parameters. Uncertainty in the length of the primary or secondary flight path has the least effect on the positions of the peaks of H, D and He, which are dominated by the accuracy of the calibration of the detector angles. This aspect of the calibration of a TOF spectrometer therefore demands close attention to achieve reliable outcomes where the position of the peaks is of significant scientific interest and is discussed in detail. The corresponding sensitivities of the position of peak of the Compton profile, J(y), to flight-path parameters and sample position are also examined, focusing on the comparability across experiments of results for H, D and He. We show that positioning the sample to within a few mm of the ideal position is required to ensure good comparability between experiments if data from detectors at high forward angles are to be reliably interpreted. |
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Keywords: | Inelastic neutron scattering Neutron Compton scattering Time-of-flight Calibration |
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