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High reliability of 1.5 ?m two-step VPE-LPE-grown DC-PBH lasers |
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| Authors: | Sugou S Nishimoto H Kitamura M Mito I Yanase T |
| Affiliation: | NEC Corporation, Opto-Electronics Research Laboratories, Kawasaki, Japan; |
| Abstract: | The reliability of 1.5 ?m InGaAsP/InP DC-PBH lasers prepared by two-step hydride VPE and LPE was estimated at the 70°C, 5 mW constant-power mode. The low degradation rate (8×10?5/h) indicated high reliability of the two-step VPE-LPE-grown LDs with the VPE-grown active layer. |
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