基于变游程编码的测试数据压缩算法

基于IP核的设计思想推动了SOC设计技术的发展,却使SOC的测试数据成几何级数增长.针对这一问题,本文提出了一种有效的测试数据压缩算法——变游程(Variable-Run-Length)编码算法来减少测试数据量、降低测试成本.该算法编码时同时考虑游程0和游程1两种游程,大大减小了测试数据中长度较短游程的数量,提高了编码效率.理论分析和实验数据表明,变游程编码能取得较同类编码算法更高的压缩效率,能够显著减少测试时间、降低测试功耗和测试成本.

A Test Set Compression Algorithm Based on Variable-Run-Length Code

SOC technology has developed rapidly,which makes the test data of SOC increasing dramatically.This paper presents an effective test data compression algorithm,Variable-Run-Length code.Both runs of 0s and runs of 1s in test data stream are mapped to codeword so as to reduce the number of short runs and improve compression radio.Theoretical analysis and experimental results show that Variable-Run-Length code can provide a higher compression radio than other compression algorithms and it also leads to a significant saving in peak and average power due to a careful mapping of the don't-cares in precomputed test sets to 1's and 0's.