| 用GTEM室做EMI测试的电小尺寸概念 |
| |
| 引用本文： | 薛谦忠,陈志雨. 用GTEM室做EMI测试的电小尺寸概念[J]. 电波科学学报, 2002, 17(6): 670-673 |
| |
| 作者姓名： | 薛谦忠 陈志雨 |
| |
| 作者单位： | 中国科学院电子学研究所,北京,100080 |
| |
| 基金项目： | 国家自然科学基金资助项目 (60 1710 0 2 ) |
| |
| 摘 要： | 目前用GTEM室做辐射EMI测试的方法仅适用于电小尺寸辐射体,如何正确理解这个电小尺寸的概念是实用中很重要的问题,文章通过数学推导进一步明确了这个条件。
|
| 关 键 词： | GTEM室 电小尺寸 EMI测试 反向激励系数 |
| 文章编号： | 1005-0388(2002)06-0670-04 |
The condition of "electrically small" concept on EMI testing in GTEM chamber |
| |
| XUE Qian zhong CHEN Zhi yu. The condition of "electrically small" concept on EMI testing in GTEM chamber[J]. Chinese Journal of Radio Science, 2002, 17(6): 670-673 |
| |
| Authors: | XUE Qian zhong CHEN Zhi yu |
| |
| Abstract: | EMI testing method by means of GTEM cells is only applicable to the devices under test (DUT) that is electrically small. Acquiring a deep understanding of the conception for the "electrically small" is important in its applications. In this paper, the application condition is quantitatively given by the mathematical derivations. |
| |
| Keywords: | GTEM cells electrically small size EMI testing |
| 本文献已被 CNKI 维普 万方数据 等数据库收录！ |
