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An Improved Transient Calorimetric Technique for Measuring the Total Hemispherical Emittance of Nonconducting Materials (Emittance Evaluation of Glass Sheets)
Authors:H Masuda  S Sasaki  H Kou  H Kiyohashi
Affiliation:(1) Faculty of Technology, Tohoku Gakuin University, 1-13-1 Chuo, Tagajo, 985-8537, Japan;(2) Department of Mechanical Engineering, Ichinoseki National College of Technology, Hagisho-Aza-Takanashi, Ichinoseki, 021-8511, Japan;(3) Department of Information Mechanical Engineering, Daeble University, Chonnam, 526-890, Korea;(4) Department of Electrical Engineering, Ichinoseki National College of Technology, Hagisho-Aza-Takanashi, Ichinoseki, 021-8511, Japan
Abstract:For measurements of the total hemispherical emittance epsi h of nonconducting materials, a problem of the thermal gradient produced in a sample specimen arises. An improved transient calorimetric technique to reduce the thermal gradient is proposed in this study. Glass sheets (borosilicate), semi-transparent for radiation, are selected as the nonconducting test material. The epsi h values of the glass sheets for various thicknesses are measured, and their results are presented as functions of thickness and temperature. The thermal gradients in the specimens are calculated by a three-dimensional analysis, and the corner effect due to them on the measured epsi h is estimated. It is shown that the proposed technique is useful for measuring the emittance epsi h of nonconducting materials.
Keywords:calorimetric technique  glass sheet  nonconducting materials  total hemispherical emittance  thermal radiation
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