An Improved Transient Calorimetric Technique for Measuring the Total Hemispherical Emittance of Nonconducting Materials (Emittance Evaluation of Glass Sheets) |
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Authors: | H Masuda S Sasaki H Kou H Kiyohashi |
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Affiliation: | (1) Faculty of Technology, Tohoku Gakuin University, 1-13-1 Chuo, Tagajo, 985-8537, Japan;(2) Department of Mechanical Engineering, Ichinoseki National College of Technology, Hagisho-Aza-Takanashi, Ichinoseki, 021-8511, Japan;(3) Department of Information Mechanical Engineering, Daeble University, Chonnam, 526-890, Korea;(4) Department of Electrical Engineering, Ichinoseki National College of Technology, Hagisho-Aza-Takanashi, Ichinoseki, 021-8511, Japan |
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Abstract: | For measurements of the total hemispherical emittance
h
of nonconducting materials, a problem of the thermal gradient produced in a sample specimen arises. An improved transient calorimetric technique to reduce the thermal gradient is proposed in this study. Glass sheets (borosilicate), semi-transparent for radiation, are selected as the nonconducting test material. The
h
values of the glass sheets for various thicknesses are measured, and their results are presented as functions of thickness and temperature. The thermal gradients in the specimens are calculated by a three-dimensional analysis, and the corner effect due to them on the measured
h
is estimated. It is shown that the proposed technique is useful for measuring the emittance
h
of nonconducting materials. |
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Keywords: | calorimetric technique glass sheet nonconducting materials total hemispherical emittance thermal radiation |
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