| Measurement of the Residual Modal Reflectivity of AR Coating on a SLD |
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| 作者姓名： | MA Dongge SHI Jiawei LIU Mingda JIN Ensun GAO Dingsan |
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| 作者单位： | Jinn University，Changchun 130023，CHN |
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| 基金项目： | the Doctor Fund of the State Educational Commission of China |
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| 摘 要： | ＭｅａｓｕｒｅｍｅｎｔｏｆｔｈｅＲｅｓｉｄｕａｌＭｏｄａｌＲｅｆｌｅｃｔｉｖｉｔｙｏｆＡＲＣｏａｔｉｎｇｏｎａＳＬＤ￥ＭＡＤｏｎｇｇｅ；ＳＨＩＪｉａｗｅｉ；ＬＩＵＭｉｎｇｄａ；ＪＩＮＥｎｓｕｎ；ＧＡＯＤｉｎｇｓａｎ（ＪｉｎｎＵｎｉｖｅｒｓｉｔｙ，Ｃｈ...
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| 关 键 词： | 防反射涂层 光学薄膜 光谱分析 光电器件 SLD 剩余模态反射率 超发光二极管 |
| 收稿时间： | 1995/3/13 |
Measurement of the Residual Modal Reflectivity of AR Coating on a SLD |
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| MA Dongge,SHI Jiawei,LIU Mingda,JIN Ensun,GAO Dingsan.Measurement of the Residual Modal Reflectivity of AR Coating on a SLD[J].Semiconductor Photonics and Technology,1996,2(1):6-9,13. |
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| Authors: | MA Dongge SHI Jiawei LIU Mingda JIN Ensun GAO Dingsan |
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| Abstract: | The superluminescent diode has been fabricated by applying an AR coating to the output facet of the semiconductor laser for the purpose of eliminating or suitably reducing the optical feedback.An exact method for measuring the modal reflectivity of the antireflec-tion coating to a laser diode is described.It is based on measurements of the spectrum modula-tion depth of the resulting superuminescent diode output spectrum at arbitray injection cur-rent,and modal reflectivity of less than 3×10^{-4} is obtained. |
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| Keywords: | Antireflection Coatings Optical Films Spectral Analysis OptoelectronicDevices |
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