Impact of Al composition on RF noise figure of AlGaAs/GaAsheterojunction bipolar transistors |
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Authors: | Costa D |
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Affiliation: | PCSI, San Diego, CA; |
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Abstract: | The influence of Al content on the RF noise characteristics of Al xGa1-xAs/GaAs heterojunction bipolar transistors (HBT's) is presented. It is shown that the minimum noise figure (Fmin) at 2 GHz is reduced by increasing the Al mole fraction (x). This observed improvement in noise figure is directly correlated to the differences in dc current gain. The lowest measured Fmin(2 GHz) of HBT's with emitter dimensions 2×(3.5×30) μm2, were 1.3, 1.61, and 2.1 dB for x=0.35, 0.30, and 0.25 devices, respectively at Ic=3 mA. The measured results were found to agree well with calculated values over a wide range of collector currents |
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