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Imaging of optical disc using reflection-mode scattering-type scanning near-field optical microscopy
Authors:M. Yamaguchi,Y. Sasaki,H. Sasaki,T. Konada,Y. Horikawa,A. Ebina,T. Umezawa,&   T. Horiguchi
Affiliation:Olympus Optical Co. Ltd., 2-3 Kuboyama-cho Hachioji-shi Tokyo 192-8512, Japan,;Teijin Ltd., 4-3-2 Asahigaoka, Hino-shi, Tokyo 191-8512, Japan
Abstract:A phase-change optical disc was observed using a reflection-mode scattering-type scanning near-field optical microscope (RS-SNOM). In an a.c.-mode SNOM image, the 1.2 μm × 0.6 μm recording marks were successfully observed although the data were recorded on the groove. In contrast, no recording marks could be resolved in a d.c.-mode SNOM image. These results are in good agreement with those from a numerical simulation using the finite difference time domain method. The resolution was better than 100 nm with a.c.-mode SNOM operation and the results indicate that recording marks in phase-change optical media can be directly observed with the RS-SNOM.
Keywords:Apertureless probe    atomic force microscopy    microcantilever    phase-change optical disc    reflection-mode scattering-type scanning near-field optical microscope
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