| 成像标定法测量半导体激光器慢轴远场分布 |
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| 引用本文： | 任杰,洪治. 成像标定法测量半导体激光器慢轴远场分布[J]. 光学仪器, 2003, 25(6): 8-11 |
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| 作者姓名： | 任杰 洪治 |
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| 作者单位： | 浙江大学现代光学仪器国家重点实验室,浙江,杭州,310027 |
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| 摘 要： | 利用远场成像及标定对比方法,建立了半导体激光器慢轴远场分布的CCD测量系统。介绍了测量的原理和测量系统的组成,并给出了半导体激光器慢轴远场分布的测量结果。实验结果表明,该方法实时性好,测量快速、准确,人为误差因素少,适合仪器化。
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| 关 键 词： | 半导体激光器 远场分布 CCD测量 成像 标定 |
| 文章编号： | 1005-5630(2003)06-0008-04 |
| 修稿时间： | 2003-05-23 |
Far-field distribution measurement of a laser diode by using CCD with imaging and calibration technique |
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| REN Jie,HONG Zhig University,Hangzhou,China. Far-field distribution measurement of a laser diode by using CCD with imaging and calibration technique[J]. Optical Instruments, 2003, 25(6): 8-11 |
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| Authors: | REN Jie HONG Zhig University Hangzhou China |
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| Affiliation: | REN Jie,HONG Zhig University,Hangzhou 310027,China) |
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| Abstract: | A CCD far-field distribution measurement system with imaging and calibration techniques was established to measure the far-filed distribution along the slow axis of LD.The principle and setup of the system are introduced.Some experimental results are reported which show that the system is capable of realizing real-time,quick,accurate,and less artificial error measurement.The experimental system can be suitably developed to an instrument. |
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| Keywords: | laser diode far-field distribution CCD measurement image transformation calibration |
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