| 基于SOPC技术的集成电路芯片自动测试系统 |
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| 引用本文： | 刘映群.基于SOPC技术的集成电路芯片自动测试系统[J].计算机与现代化,2010(6):140-143. |
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| 作者姓名： | 刘映群 |
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| 作者单位： | 广东岭南职业技术学院信息工程学院,广东,广州,510663 |
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| 摘 要： | 介绍一种基于SOPC（可编程片上系统）技术实现的集成电路芯片自动测试系统,采用支持NIOSⅡ软核的Cylone Ⅱ EP2C35器件为主要部件,并将测试结果通过LCD液晶显示器显示出来。将此系统用于测试74系列中、小规模集成电路芯片,达到了很高的精度,而且可以利用FPGA软、硬件的可编程性,灵活地实现对其它系列器件的测试。
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| 关 键 词： | 可编程片上系统 IP核 集成电路 自动测试系统 |
Integrated Circuit Chip Automatic Test System Based on SOPC Technology |
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| LIU Ying-qun.Integrated Circuit Chip Automatic Test System Based on SOPC Technology[J].Computer and Modernization,2010(6):140-143. |
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| Authors: | LIU Ying-qun |
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| Affiliation: | School of Information Engineering/a>;Guangdong Lingnan Institute of Technology/a>;Guangzhou 510663/a>;China |
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| Abstract: | This paper introduces a integrated circuit chip automatic test systems based on SOPC technology,NIOS Ⅱ soft-core Cy-lone ⅡEP2C35 device is used as the main component. Test results are displayed through the liquid crystal display. When this system applying to test in small and medium-scale integrated circuit chip of 74 series,it reaches very high precision,and can take advantage of FPGA hardware and software programmability,flexibly implementation of other devices test. |
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| Keywords: | SOPC IP core integrated circuit automatic test system |
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