| 手机用TFT-LCD驱动控制芯片的测试电路结构设计 |
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| 引用本文： | 李博,魏廷存,樊晓桠.手机用TFT-LCD驱动控制芯片的测试电路结构设计[J].微电子学与计算机,2006,23(12):125-128. |
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| 作者姓名： | 李博 魏廷存 樊晓桠 |
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| 作者单位： | 西北工业大学,航空微电子中心,陕西,西安,710072 |
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| 基金项目： | 国家高技术研究发展计划(863计划);陕西省科技攻关项目 |
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| 摘 要： | 文章从分析手机用TFT-LCD驱动控制芯片的测试需求和芯片结构出发，提出了一种针对该芯片的测试电路结构设计方案。该方案采用多条扫描链对芯片内的多个异构的模块进行隔离，保证了各个模块有较高的测试独立性。考虑到内置SRAM的特殊性，采用边界扫描方式进行测试，提高了测试的灵活性，减少了测试电路的面积。电平敏化扫描链的引入．大大提高了Source Driver测试的可控制性。该方案支持手机用TFT-LCD驱动控制芯片的常规以及特殊项目的测试。
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| 关 键 词： | 测试电路 TFT-LCD驱动芯片 混合信号电路测试 |
| 文章编号： | 1000-7180（2006）12-0125-04 |
| 收稿时间： | 2005-12-14 |
| 修稿时间： | 2005-12-14 |
The Architecture Design of Test Circuits of the TFT-LCD Driver IC Used for Mobile Phone |
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| LI Bo,WEI Ting-cun,FAN Xiao-ya.The Architecture Design of Test Circuits of the TFT-LCD Driver IC Used for Mobile Phone[J].Microelectronics & Computer,2006,23(12):125-128. |
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| Authors: | LI Bo WEI Ting-cun FAN Xiao-ya |
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| Abstract: | In this paper, the test requirement and architecture of the TFT-LCD driver IC used for mobile phone are analyzed, and a design method of test circuits for this kind of driver IC is proposed. Multi scan path method is used for realizing the independent test of all circuit blocks, and the BSD method is used for the test of built-in SRAM with special architecture, which improved the flexibility of test and reduced the chip size of test circuits. The LSSD method is used for source driver test that is easy to control. The design method proposed in this paper can support normal and special tests of TFT-LCD driver IC very well. |
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| Keywords: | Test circuit TFT-LCD driver IC Mixed-signal IC test |
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