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栅极系统电子返流对离子推力器寿命影响
引用本文:贾艳辉,李忠明,张天平,李小平,陈继巍,陈娟娟. 栅极系统电子返流对离子推力器寿命影响[J]. 真空与低温, 2012, 0(1): 21-25
作者姓名:贾艳辉  李忠明  张天平  李小平  陈继巍  陈娟娟
作者单位:兰州空间技术物理研究所;义乌工商学院机电信息分院
基金项目:真空低温技术与物理重点实验室基金项目(9140C550211120C5501)资助
摘    要:栅极系统电子返流是离子推力器寿命的主要失效模式之一。以20 cm Xe离子推力器地面运行测试数据为基础,结合离子推力器栅极系统电子返流失效机理,预测了离子推力器在地面测试环境中和空间飞行环境中栅极系统电子返流对寿命的影响。预测结果表明:20 cm Xe离子推力器在地面试验环境中和空间飞行环境中的预期寿命分别为6 600 h和17 000 h。

关 键 词:加速栅  电荷交换离子  电子返流  离子推力器

THE EFFECT OF GRIDS SYSTEM ELECTRON BACKSTREAMING ON ION THRUSTER LIFE
JIA Yan-hui,LI Zhong-ming,ZHANG Tian-ping,LI Xiao-ping,CHEN Ji-wei,CHEN Juan-juan. THE EFFECT OF GRIDS SYSTEM ELECTRON BACKSTREAMING ON ION THRUSTER LIFE[J]. Vacuum and Cryogenics, 2012, 0(1): 21-25
Authors:JIA Yan-hui  LI Zhong-ming  ZHANG Tian-ping  LI Xiao-ping  CHEN Ji-wei  CHEN Juan-juan
Affiliation:1(1.Lanzhou Institute of Physics,Lanzhou 730000,China;2.School of Electro-Mechanical and Information Technology,Yiwu Industrial& Commercial college,Yiwu 322000,China)
Abstract:Grids system electron backstreaming is one of key failure models for ion thruster.This paper that is based on the 20 cm Xe ion thruster operation data and considered the failure mechanism of ion thruster grids system electron backsteraming,evaluate the effect of electron backstreaming on ion thruster for operating on ground and space.The result indicated that the life of 20 cm Xe ion thruster while appear electron backstreaming are 6 600 h and 17 000 h for operating on ground and space respectively.
Keywords:accelerator grid  CEX  electron backstreaming  ion thruster
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