Generation-Recombination Noise: The Fundamental Sensitivity Limit for Kinetic Inductance Detectors |
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| Authors: | P. J. de Visser J. J. A. Baselmans P. Diener S. J. C. Yates A. Endo T. M. Klapwijk |
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| Affiliation: | 1. SRON, Netherlands Institute for Space Research, Sorbonnelaan 2, 3584CA, Utrecht, The Netherlands
2. Physics of NanoElectronics Group, Kavli Institute of Nanoscience, Faculty of Applied Sciences, Delft University of Technology, Lorentzweg 1, 2628CJ, Delft, The Netherlands
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| Abstract: | We present measurements of quasiparticle generation-recombination noise in aluminium Microwave Kinetic Inductance Detectors, the fundamental noise source for these detectors. Both the quasiparticle lifetime and the number of quasiparticles can be determined from the noise spectra. The number of quasiparticles saturates to 10?μm?3 at temperatures below 160?mK, which is shown to limit the quasiparticle lifetime to 4?ms. These numbers lead to a generation-recombination noise limited noise equivalent power (NEP) of 1.5×10?19?W/Hz1/2. Since NEP∝N qp , lowering the number of remnant quasiparticles will be crucial to improve the sensitivity of these detectors. We show that the readout power now limits the number of quasiparticles and thereby the sensitivity. |
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