基于单片机的双波长红外测温结构设计 |
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引用本文: | 关国坚,甘志银.基于单片机的双波长红外测温结构设计[J].机电一体化,2012,18(4):57-62. |
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作者姓名: | 关国坚 甘志银 |
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作者单位: | 华中科技大学机械科学与工程学院,武汉430074;广东昭信半导体装备制造有限公司,佛山528200 |
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基金项目: | 2010年广东省重大科技专项 |
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摘 要: | 为了解决双波长测温不同波长的变换和精确定位测量的问题,设计了一种基于单片机的变换结构,利用电机匀速反馈控制电路和单片机周期捕获功能,准确跟踪和定位采样位置。基于这种结构提出了一种双波长测温法的暗电流电压修正方法,大大提高了测量的精度。通过实验使用设计的测量结构拟合出双波长温度测量函数,测量精度在1℃之内。
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关 键 词: | 双波长测温 波长变换结构 反馈控制 单片机 暗电流修正 |
Structural Design of Dual-wavelength Colorimeter Based on the Single Chip |
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Abstract: | Aimed at solving the problem of wavelength changing and position locating for dual-wavelength colorimeter, a wavelength changing-over design with high precise position using motor feedback control circuit and programmable counter array (PCA) circle capture based on the single chip is proposed. Meanwhile, a dark circuit correction algorithm is analyzed, with which the measurement precision is greatly improved. Finally, the function of the measurement is completed by experiment, with precision within 1℃. |
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Keywords: | dual-wavelength colorimeter wavelength changing-over mechanism feedback control single chip dark circuit correction algorithm |
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