基于缺陷俘获理论的CCD转移模型及应用

空间天文探测常使用电荷耦合器件(CCD)作为主要探测器，但极端辐射环境会对CCD性能造成影响，进而影响数据获取。为了深入了解此机制对数据获取的影响，文章基于SRH(Schokley-Read-Hall)理论，分别讨论转移过程中缺陷对电荷捕获以及释放作用，并在CCD电极层面基础上建立转移模型，仿真不同情况下缺陷运行原理。使用此模型模拟仿真STP(Single Trap Pumping)时序，分别讨论实际使用过程中时序对数据获取的影响，以及从STP时序数据中提取相关参数的办法，并讨论各参数间的关系。该模型对于理解辐射缺陷对CCD数据转移的影响，仿真STP时序，以及在实际应用中利用STP时序获取CCD缺陷参数有辅助作用。

CCD Charge Transfer Model and Applications Based on SRH Theory

Space astronomical detection commonly uses CCD as the main detector. However, the extreme radiation environment can affect CCD performance and, in turn, impact data acquisition. To gain a deeper understanding of the mechanism''s impact on data acquisition, in this paper, based on the SRH theory, the defects'' effects on charge capture and release during transfer was discussed. A transfer model based on the CCD electrode level was established, and the operation principle of defects under different conditions was simulated. The model was used to simulate STP timing, and to discuss the impact of timing on data acquisition in actual use and the method of extracting relevant parameters from STP timing data, as well as the relationship between the parameters. The model assists in understanding the impact of radiation defects on CCD data transfer, simulating STP timing, and utilizing STP timing to acquire CCD defect parameters in actual applications.