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Investigation of Tunnel-Regenerated Multi-Active-Region Light-Emitting Diodes (TRMAR LED) by Scanning Thermal Microscopy (STHM)
Authors:T.H. Lee   X. Guo   G.D. Shen   Y. Ji   G.H. Wang   J.Y. Du   X.Z. Wang   G. Gao   A. Altes   L.J. Balk  J.C.H. Phang
Affiliation:1. Fachbereich Elektrotechnik & Informationstechnik, Bergische Universität Wuppertal, Fuhlrottstr. 10, D-42097 Wuppertal, Germany;2. Center for Integrated Circuit Failure Analysis and Reliability (CICFAR), Faculty of Engineering, National University of Singapore, 10 Kent Ridge Crescent, Singapore 119260;3. Beijing Polytechnic University, Beijing 100022, China;1. College of Science, Civil Aviation University of China, Tianjin 300300, China;2. School of Electronics and Information Engineering, Tianjin Polytechnics University, Tianjin 300160, China
Abstract:
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