显微材料测量的新方法

由于显微镜物镜焦深范围有限,造成显微图像局部模糊,研究人员无法对显微材料进行测量等问题。本文根据聚焦评价函数分布,采用小波分析,将一系列局部聚焦图像合成全焦图像。第一步,通过被测图像小波变换域低频部分提取观察物的成像轮廓在系列图像中的位置,将观察物轮廓在空域中进行叠合;第二步,分析聚焦部分和模糊区域在小波变换域内图像能量分布的不同,提出以其高频部分与低频部分的比值为特征参照值,通过比较,提取聚焦部分图像的小波参数进行序列图像融合。改进的小波融合算法速度快,融合图像以取最值的方式极大地保留了系列图像聚焦部分的信息,合成全焦图像。由此得出的聚焦合成图像使研究人员可直接测量所需的显微结果。

The New Method of Material Microstructure Measurement

The focus depth of the microscope is limited,so micrograph is faint locally and researchers understand image incompletely.Through the distribution of focusing evaluate function,a set of local focusing images was synthesized to one full focus image by using wavelet analysis.Firstly,with the wavelet transform,removed the noise,and an evaluate function of the entropy made the object outline of these images superpose better.Secondly,through the wavelet analysis of a single image,the rate of the high frequency and the low frequency is distinct.And through picking up the extremum of this rate over the set of the images,we fused a full-focus image.With this method,we can hold back mostly valuable information of the set of images.From the microscopy full-focus image,researchers can measure the results they need.