Morphological analysis of poly(o-methoxyaniline) thin-films deposited by spin coating technique |
| |
| Authors: | John Paul H. Lima Adnei M. de Andrade |
| |
| Affiliation: | 1. GEM, Departamento de Sistemas Eletr?nicos, Escola Politécnica, Universidade de S?o Paulo, 05508-970, S?o Paulo, Brazil
|
| |
| Abstract: | Morphological study of conducting polymer thin films obtained by spin coating is reported. Poly(o-methoxyaniline) films were deposited onto glass substrates and analyzed by profilometry and atomic force microscopy (AFM). It is shown that final thickness is correlated by a power law with spin speed with a solution concentration varying coefficient and that surface roughness decreases with increasing spin speed. |
| |
| Keywords: | |
| 本文献已被 SpringerLink 等数据库收录！ |
|
