| 应用于ESD防护电路的抗噪声LVTSCR组件研究 |
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| 引用本文： | 马万里. 应用于ESD防护电路的抗噪声LVTSCR组件研究[J]. 电子与封装, 2012, 0(8): 40-43 |
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| 作者姓名： | 马万里 |
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| 作者单位： | 深圳方正微电子有限公司,广东深圳518116 |
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| 摘 要： | 应用于ESD防护的低压触发SCR组件,当受到电路噪声干扰时,极易造成SCR组件的误导通,进而影响到电路的正常功能,严重时可以产生持续的闩锁效应,造成SCR组件烧毁。通过改进SCR的结构,提高该SCR组件的触发电流,或者提高该SCR组件的保持电压,使其抗噪声干扰能力大大增强。另外,文中对触发电流与温度的关系、保持电压与N+区宽度的关系也做了分析。
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| 关 键 词： | 静电防护 可控硅 闩锁 噪声 触发电流 保持电压 |
Research on Antinoise LVTSCR Device Which be Applied to ESD Protection Circuit |
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| MA Wan-li. Research on Antinoise LVTSCR Device Which be Applied to ESD Protection Circuit[J]. Electronics & Packaging, 2012, 0(8): 40-43 |
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| Authors: | MA Wan-li |
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| Affiliation: | MA Wan-li(Founder Microelectronics International Co.,Ltd,Shenzhen 518116,China) |
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| Abstract: | Low voltage triggered SCR device is prone to be triggered by circuit noise when be applied to ESD protection circuit.Thus,it will impact on circuit function of IC.What is more,it perhaps cause serious latch up issue,SCR device will be burnt.Via optimizing SRC device,improving triggering current and holding voltage,SRC device can be immune form these circuit noise.Furthermore,the relation between triggering current and temperature,the relation between holding voltage and width of N+ area been analyzed. |
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| Keywords: | ESD SCR latch up noise trigger current holding voltage |
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