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星型边界扫描拓扑的测试方法研究
引用本文:黄文君,雷加. 星型边界扫描拓扑的测试方法研究[J]. 国外电子测量技术, 2011, 30(6): 54-57
作者姓名:黄文君  雷加
作者单位:桂林电子科技大学电子工程与自动化学院,桂林,541004
基金项目:广西研究生科研创新项目
摘    要:针对在串行边界扫描拓扑中不能对测试存取端口控制器直接寻址而导致测试速率降低的问题,IEEE 1149.7标准提出了可直接寻址的星型拓扑测试方法.以该标准为依据,利用QuartusⅡ软件设计了在测试系统中具有关键作用的边界扫描测试控制器,介绍了星型拓扑结构的测试原理与测试流程、控制器的结构与作用.仿真结果表明控制器能够产...

关 键 词:边界扫描  星型扫描拓扑  串行等价扫描

Research on test method of star boundary scan topology
Huang Wenjun,Lei Jia. Research on test method of star boundary scan topology[J]. Foreign Electronic Measurement Technology, 2011, 30(6): 54-57
Authors:Huang Wenjun  Lei Jia
Affiliation:Huang Wenjun Lei Jia(School of Electronic Engineering and automation,Guilin University of Electronic Technology,Guilin 541004,China)
Abstract:As series boundary scan topology can not address the test access port controller,which leads to low test rate,IEEE 1149.7 provides a solution of star topology.Based on the standard,QuartusⅡ is used to complete boundary scan test controller that plays an important role in test system.Test principle and process,as well as test controller’s structure and functions are given.Emulation result proves that test controller can generate test signals which can meet the principle requirements.It is available and effective,and it maks a contribution on the test system.
Keywords:boundary scan  star scan topology  series equivalent scan
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