Correlation Between Static and Dynamic Parameters of A-to-D Converters: In the View of a Unique Test Procedure |
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Authors: | F. Azaïs S. Bernard Y. Bertrand M. Comte M. Renovell |
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Affiliation: | (1) LIRMM—CNRS/University of Montpellier, 161, Rue Ada, 34392 Montpellier, Cedex 5, France |
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Abstract: | ADCs are fully characterized by both static and dynamic parameters. Testing methods usually combine a histogram-based approach with a spectral analysis to determine the complete set of ADCs parameters. In the view of a unique test procedure, this paper investigates the correlation between both kinds of parameters. Experimental results demonstrate that under appropriate test conditions, the dynamic parameters extracted from a classical FFT exhibit significant variations against ADC offset, gain and non-linearity errors, opening the way of a low-cost test strategy in the frequency domain. |
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Keywords: | analog and mixed-signal testing ADC test spectral analysis |
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