| PEEK的表面改性和表征 |
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| 引用本文： | 陈睿超;孙辉;许国志. PEEK的表面改性和表征[J]. 中国塑料, 2011, 25(5): 17-23 |
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| 作者姓名： | 陈睿超 孙辉 许国志 |
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| 作者单位： | 北京工商大学材料系 北京工商大学 |
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| 基金项目： | 北京市教委科技面上项目(KM201010011004); 教育部留学归国人员科研启动基金 |
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| 摘 要： | 简要介绍了聚醚醚酮(PEEK)的一些特性及应用。综述了近年来用于PEEK薄膜表面改性的几种方法，包括等离子体处理、紫外辐照及湿化学法等。此外，简要概括了改性PEEK表面的表征方法，如扫描电子显微镜、X射线光电子能谱仪和原子力显微镜等。
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| 关 键 词： | 表面改性 聚醚醚酮 表面表征 |
| 收稿时间： | 2010-11-10 |
Surface Modification and Characterization of PEEK |
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| CHEN Ruichao,SUN Hui,XU Guozhi. Surface Modification and Characterization of PEEK[J]. China Plastics, 2011, 25(5): 17-23 |
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| Authors: | CHEN Ruichao SUN Hui XU Guozhi |
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| Affiliation: | CHEN Ruichao,SUN Hui,XU Guozhi(School of Materials and Mechanical Engineering,Beijing Technology and Business University,Beijing 100048,China) |
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| Abstract: | Some features and applications of poly(ether ether ketone) were briefly introduced.Several recent surface modification methods for PEEK films were reviewed,including plasma treatment,ultraviolet irradiation,and wet chemistry.In addition,several major surface characterization methods such as scanning electron microscope(SEM),X-ray photoelectron spectroscopy(XPS) and atomic force microscope(AFM) were described. |
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| Keywords: | poly(ether ether ketone) surface modification surface characterization |
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