| 基于Twain接口的AOI系统 |
| |
| 引用本文： | 邹传瑜,刘万春,潘云东.基于Twain接口的AOI系统[J].计算机工程,2004,30(20):177-179. |
| |
| 作者姓名： | 邹传瑜 刘万春 潘云东 |
| |
| 作者单位： | 北京理工大学信息科学技术学院,北京,100081 |
| |
| 摘 要： | 以工业PCB检测为研究对象，建立了一种基于Twain接口的新型AOI系统，重点研究了Twain接口的管理、颜色空间的选取和PCB瑕疵检测的方法。结合实际应用对如何提高检测速度和检测效率进行了较为深入的探讨，实验结果验证了该系统的可行性。
|
| 关 键 词： | AOI Twain 颜色空间 PCB 多参考比较法 |
| 文章编号： | 1000-3428(2004)20-0177-03 |
AOI System Based on Twain Interface |
| |
| ZOU Chuanyu,LIU Wanchun,PAN Yundong.AOI System Based on Twain Interface[J].Computer Engineering,2004,30(20):177-179. |
| |
| Authors: | ZOU Chuanyu LIU Wanchun PAN Yundong |
| |
| Abstract: | Focus on industrial PCB inspection, this paper designs a new-style AOI system based on Twain interface. Emphases are relaid on the management of Twain, the selection of color space and the method to detect faults. It also discusses how to speed up inspection pace and enhance the inspection performance. Experimental results indicate that this system is feasible. |
| |
| Keywords: | AOI Twain Color space PCB Multi-references comparison approach |
| 本文献已被 CNKI 维普 万方数据 等数据库收录！ |
