Electrical and optical investigations on Pb1 − 3x/2LaxZr0.2Ti0.8O3 thin films obtained by radiofrequency assisted pulsed laser deposition期刊界 All Journals 搜尽天下杂志传播学术成果专业期刊搜索期刊信息化学术搜索

Electrical and optical investigations on Pb_1 − 3x/2La_xZr_0.2Ti_0.8O₃ thin films obtained by radiofrequency assisted pulsed laser deposition

Authors:	ND ScarisoreanuA Andrei R BirjegaF Craciun C GalassiD Raducanu M Dinescu

Affiliation:	^a National Institute for Research and Development in Microtehnologies, Iancu Nicolae 126A, 077190 Bucharest, Romania ^b National Institute for Laser, Plasma and Radiation Physics, PO Box MG-16 Magurele, 077125 Bucharest, Romania ^c CNR-ISC, Istituto dei Sistemi Complessi, Area della Ricerca Roma-Tor Vergata, Via del Fosso del Cavaliere 100, I-0013, Rome, Italy ^d CNR-ISTEC, Via Granarolo 64, I-48018 Faenza, Italy ^e POLITEHNICA University of Bucharest, Spl. Independentei 313, 060042, Bucharest, Romania

Abstract:	Thin films of ferroelectric relaxor Pb_1 − 3x/2La_xZr_0.2Ti_0.8O₃, x = 0.22 have been integrated in an oxidic heterostructure for electro-optical investigations. The quadratic electro-optic behavior and optical properties have been studied by means of variable angle spectroscopic ellipsometry method in reflection mode. Birefringence values up to δΔ = 0.17° have been obtained for quadratic compositions at λ = 540 nm and 65° angle of incidence. Structural, chemical and morphologic properties of Pb_1-3x/2La_xZr_0.2Ti_0.8O₃ (x = 0.22) thin films have been investigated by x-ray diffraction and atomic force microscopy techniques. The dielectric and ferroelectric behavior has been investigated using dielectric spectroscopy and a ferroelectric test system.

Keywords:	Thin films Ferroelectric materials Laser ablation Ellipsometry
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