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Etching of SiC in Low Power Inductively-Coupled Plasma
Authors:Osipov  A. A.  Aleksandrov  S. E.  Solov’ev  Yu. V.  Uvarov  A. A.  Osipov  A. A.
Affiliation:1.Peter the Great St. Petersburg Polytechnical University, 195251, St. Petersburg, Russia
;2.CORIAL, 38190, Bernin, France
;3.Institute of Mineralogy, Urals Branch, Russian Academy of Sciences, 456317, Miass, Russia
;
Abstract:Russian Microelectronics - The peculiarities of etching 4H silicon carbide (4H-SiC) in F-containing inductively-coupled plasma at lowered values of power absorbed in an RF discharge are considered....
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