| 一种高可靠性可控硅的验证方法 |
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| 引用本文： | 刘杰,王普. 一种高可靠性可控硅的验证方法[J]. 桂林工学院学报, 2010, 30(2): 305-307 |
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| 作者姓名： | 刘杰 王普 |
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| 作者单位： | 北京工业大学,电子信息与控制工程学院,北京,100022 |
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| 摘 要： | 利用信息熵法,针对高可靠性可控硅产品设计了试验验证方法。通过试验,用较小的样本量验证了产品的可靠性,找到了目前导致洗衣机电脑面板故障、返修率升高的主要原因是可控硅的可靠性达不到指标要求。
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| 关 键 词： | 可控硅 小样本 可靠性 熵 |
SCR Test Method with High Reliability |
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| LIU Jie,WANG Pu. SCR Test Method with High Reliability[J]. Journal of Guilin University of Technology, 2010, 30(2): 305-307 |
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| Authors: | LIU Jie WANG Pu |
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| Affiliation: | (College of Electronic Information and Control Engineering,Beijing University of Technology,Beijing 100022,China) |
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| Abstract: | Verifying the reliability of high-reliability products is difficult in this field.The high-reliability SCR test methods are studied by the information entropy method.In the test,small samples are applied to finish the verifying.The main cause of panel computer in washing-machine failure and the increase of repair rate are found. |
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| Keywords: | SCR small-sample reliability entropy |
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