Zero aliasing ROM BIST

Signature analyzers are very efficient output response compactors for BIST design. The only limitation of signature analysis is the fault coverage reduction (aliasing) due to the information loss inherent to any data compaction. In this article, in order to increase the effectiveness of ROM BIST, we take advantage from the simplicity of the error patterns generated by ROMs and we show that aliasing free signature analysis can be achieved in ROM BIST.This work was performed when the author was on leave from Minsk Radio Engineering Institute, Computer Department, Belorus.