| 基于低频噪声检测光耦器件可靠性的频域筛选方法? |
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| 引用本文： | 陈晓娟,王文婷,景非. 基于低频噪声检测光耦器件可靠性的频域筛选方法?[J]. 电子器件, 2015, 0(1) |
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| 作者姓名： | 陈晓娟 王文婷 景非 |
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| 作者单位： | 1. 东北电力大学信息工程学院,吉林 吉林,132012
2. 北京邮电大学计算机学院,北京,100000 |
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| 摘 要： | 针对光耦器件可靠性筛选，提出全频段阈值筛选方法检测光耦器件内部低频噪声。根据光耦器件内部的低频噪声完成光耦器件可靠性的筛选。实验中利用光耦器件测试系统检测200只光耦器件内部的低频噪声，计算这200只光耦器件全频段平均噪声谱，确定筛选的阈值，再根据光耦器件可靠性分类标准，判断被测器件可靠性等级。
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| 关 键 词： | 光耦噪声筛选 低频噪声检测 过激噪声 筛选阈值 |
A Novel Method for Reliability Estimation of Optoelectronic Coupled Devices Based on Low-Frequency Noise Measurements |
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| CHEN Xiaojuan,WANG Wenting,JING Fei. A Novel Method for Reliability Estimation of Optoelectronic Coupled Devices Based on Low-Frequency Noise Measurements[J]. Journal of Electron Devices, 2015, 0(1) |
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| Authors: | CHEN Xiaojuan WANG Wenting JING Fei |
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| Abstract: | |
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| Keywords: | optoelectronic coupled devices screening low-frequency noise detection excessive noise screening threshold |
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