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X射线Rietveld方法在纳米材料研究领域的应用
引用本文:周玉华,宋武林,柯莉,曾小川,谢长生. X射线Rietveld方法在纳米材料研究领域的应用[J]. 材料导报, 2011, 0(Z1): 50-53,75
作者姓名:周玉华  宋武林  柯莉  曾小川  谢长生
作者单位:华中科技大学材料科学与工程学院模具技术国家重点实验室;华中科技大学分析测试中心;
基金项目:国家自然科学基金(51071073)
摘    要:纳米材料由于独特的微结构和奇异性能成为当今世界范围内研究与开发的热点。鉴于Rietveld方法在常规固体材料方面广泛而成功的应用,将Rietveld方法引入到纳米研究领域具有重要的意义。简要介绍了Rietveld方法的基本原理及其在纳米材料的晶体结构精修、物相定量分析和微结构分析等方面的应用。

关 键 词:纳米材料  X射线Rietveld  结构精修  定量分析  微结构分析

Applications of X-ray Rietveld Method in the Research of Nanomaterials
ZHOU Yuhua,SONG Wulin,KE Li,ZENG Xiaochuan,XIE Changsheng. Applications of X-ray Rietveld Method in the Research of Nanomaterials[J]. Materials Review, 2011, 0(Z1): 50-53,75
Authors:ZHOU Yuhua  SONG Wulin  KE Li  ZENG Xiaochuan  XIE Changsheng
Affiliation:ZHOU Yuhua~1,SONG Wulin~(1,2),KE Li~1,ZENG Xiaochuan~1,XIE Changsheng~1 (1 State Key Laboratory of Die and Mould Technology,Faculty of Materials Science and Engineering,Huazhong University of Science and Technology,Wuhan 430074,2 Analytical and Testing Center,Wuhan 430074)
Abstract:Due to the unique microstructure and singular performance of nanomaterials,it has become the highlight of research and development in the world.In view of comprehensive and successful application of Rietveld method into solid material,it is significant to introduce the method into nanometer field.The basic principle of Rietveld method and its application of the crystal structure refinement,quantitative phase analysis,microstructure analysis and so on in nanomaterials are briefly introduced.
Keywords:nanomaterials  X-ray Rietveld  structure refinement  quantitative analysis  microstructure analysis  
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