| 基于光探针的超高速波形数字化测试系统的应用 |
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| 引用本文： | 田小建, 张大明, 高艳君, 李德辉, 衣茂斌. 基于光探针的超高速波形数字化测试系统的应用[J]. 电子与信息学报, 2000, 22(2): 346-349. |
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| 作者姓名： | 田小建 张大明 高艳君 李德辉 衣茂斌 |
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| 作者单位： | 集成光电子国家重点联合实验室吉林大学实验区吉林大学电子工程系长春 130023 |
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| 摘 要： | 介绍了基于光探针的超高速波形数字化系统的结构。采用倍频移相扫描法测量了高速集成电路芯片各级的功能。分析了芯片故障产生的原因和光探针测量的特点。
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| 关 键 词： | 光探针 电光采佯 集成电路芯片 |
| 收稿时间： | 1998-06-22 |
| 修稿时间： | 1998-06-22 |
APPLICATION OF ULTRA-HIGH SPEED WAVEFORM DIGITIZED SYSTEM TO IC BASED ON LASER PROBE |
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| Tian Xiaojian, Zhang Darning, Gao Yanjun, Li Dehui, Yi Maobin. APPLICATION OF ULTRA-HIGH SPEED WAVEFORM DIGITIZED SYSTEM TO IC BASED ON LASER PROBE[J]. Journal of Electronics & Information Technology, 2000, 22(2): 346-349. |
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| Authors: | Tian Xiaojian Zhang Darning Gao Yanjun Li Dehui Yi Maobin |
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| Affiliation: | State Key Laboratory on Integrated Optoelectronics Jilin University Region Department of Electronic Engineering Jilin University Changchun 130023 |
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| Abstract: | This paper introduces the construction of the ultra-high speed waveform digitized system based on laser probe. The functions of different stages of the high-speed dynamic divider circuit chip are measured with the double-frequency phase sweeping technique. A detail analysis about the chip failure and the characteristics of laser probe measurement is given. |
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| Keywords: | Laser probe Electrooptic sampling Integrated circuit chip |
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