The dielectric function of Mgy NiHx thin films ()

Mg_y Ni (2≤y≤10) thin films covered with a Pd cap layer are hydrogenated in 10⁵  Pa H₂ between room temperature and 80 ° C and their dielectric function is determined from reflection and transmission measurements. The hydrogenated Mg_y NiH_x thin films show a continuous shift of the optical absorption towards higher photon energies with increasing y. Comparison of the obtained dielectric functions with predictions from an effective medium theory show that a considerable doping of the Mg₂ NiH₄ host takes place at least for y≤3.5 while no signature of MgH₂ is observed in that composition range in the optical spectra. This is in contrast to the predictions from the bulk phase diagram where a mixture of semiconducting Mg₂ NiH₄ (energy gap E_g=1.6  eV) and MgH₂ (E_g=5.6  eV) is expected.