| 微小电阻测量方法及关键技术 |
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| 引用本文： | 刘志存. 微小电阻测量方法及关键技术[J]. 物理测试, 2005, 23(1): 34-36 |
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| 作者姓名： | 刘志存 |
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| 作者单位： | 陕西师范大学物理学与信息技术学院,陕西,西安,710062 |
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| 摘 要： | 论述了微小电阻测量的两种方法,总结了测量采用的四个关键技术:精密恒流源、高性能测量放大器、四引线法、高精度A/D转换器。测试结果表明,采用该技术的测量电路输入阻抗高,消除了试样接触电阻的影响,可对微小电阻进行精确的测量。
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| 关 键 词： | 小电阻 四引线法 A/D转换 恒流源 |
| 文章编号： | 1001-0777(2005)01-0034-03 |
Key Technology to Measure Micro-Resistance |
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| LIU Zhi-cun. Key Technology to Measure Micro-Resistance[J]. Physics Examination and Testing, 2005, 23(1): 34-36 |
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| Authors: | LIU Zhi-cun |
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| Abstract: | Two ways to measure micro resistance were discuss ed. The key measuring technologies, ineluding high stable constant current power source, high capability gain amplifier, four probe method, and high precision A /D converter, were summarized. The results indicate that the measurement circuit using this technology has a high impedance so can be used to measure low resist ance accurately. |
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| Keywords: | micro resistance four probe method A/D conver ter constant current |
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