中子衍射法测量TATB基PBX单轴压缩的内应力研究

1,3,5-三氨基-2,4,6三硝基苯(TATB)基高聚物粘结炸药(PBX)的内应力是造成其贮存开裂和低应力破坏的重要原因。为了验证用中子衍射分析TATB基PBX内部应力的可行性,在中子残余应力谱仪(RSND)上水平安装2 kN双丝杆拉伸台,用原位中子应力测量技术测量了不同负荷状态下的内部应力的变化。结果表明,TATB晶体的(002)晶面(29°衍射角)和(412)晶面(75°衍射角)可作为中子应力观测晶面。中子衍射测量晶格间距的变化(点阵应变)与对其施加的应力呈近似线性增加的关系,随着应力的增加,点阵应变随之增加。在较为复杂的原位压缩加载/卸载过程中,晶格应变结果与复杂的应力变化过程基本保持一致。中子衍射信号强度随路径指数衰减,中子衍射深度6 mm。

Internal Stress Measurement During Uniaxial Compression for TATB Based PBX by Neutron Diffraction

Internal stress of 1,3,5-triamino-2,4,6-trinitrobenzene (TATB) based polymer bonded explosive (PBX) is an important cause of its cracking and low stress damage. For verifying the feasibility of analyzing the internal stress of TATB based PBX by neutron diffraction, 2 kN dual leadscrew was mounted horizontally on the Residual Stress Neutron Diffractometer (RSND), and the internal stress alterations were measured by the in-situ neutron stress measurement technique under different load status. Results show that the(002)crustal plane (diffraction angle 29°) and(412)crustal plane (diffraction angle 75°) of TATB crystal can be used as a neutron stress observation surface. The changes in lattice spacing measured by neutron diffraction (lattice strain) is approximately linearly increased with the applied stress on it, and the lattice strain increases with the increase of stress. In the process of more complex in-situ compressive loading/unloading, the lattice strain result is basically consistent with the complex stress change process. The neutron diffraction signal intensity decreases exponentially with the path and the neutron diffraction depth is 6 mm.