| 铝箔腐蚀液中硫酸根离子的测定 |
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| 引用本文： | 胡广军,严季新. 铝箔腐蚀液中硫酸根离子的测定[J]. 电子元件与材料, 1996, 15(4): 55-56 |
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| 作者姓名： | 胡广军 严季新 |
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| 作者单位： | 华容电子集团南通电极箔厂 |
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| 摘 要： | 在阳离子表面活性剂——十六烷基三甲基溴化铵（ＣＴＭＡＢ）的存在下，用比浊法对铝箔蚀腐液中微量硫酸根离子进行测定。硫酸根离子含量在３．０×１０－４～２．４×１０－３ｇ／５５ｍＬ范围内符合比耳定律
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| 关 键 词： | 硫酸根离子 测定 十六烷基三甲基溴化铵 |
Determination of Sulfate Ion in Etching Solution for Aluminum Foil |
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| Hu Guangjun Yan Jixin. Determination of Sulfate Ion in Etching Solution for Aluminum Foil[J]. Electronic Components & Materials, 1996, 15(4): 55-56 |
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| Authors: | Hu Guangjun Yan Jixin |
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| Affiliation: | Hu Guangjun Yan Jixin |
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| Abstract: | Traces of sulfate ions in etching solution for aluminum foil have been determined by turbidimetry in presence of cation surface activator-hexadecyl trimethyl ammonium bromide (CTMAB). The Beer's law is obeyed for content of sulfate ions from 3 0×10 -4 to 2 4×10 -3 g per 55 mL. |
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| Keywords: | sulfate ion determination hexadecyl trimethyl ammonium bromide(CTMAB) |
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