首页 | 本学科首页   官方微博 | 高级检索  
     

统计过程控制技术在键合工序中的应用
引用本文:崔波.统计过程控制技术在键合工序中的应用[J].半导体技术,2009,34(8).
作者姓名:崔波
作者单位:中国电子科技集团公司第十三研究所,石家庄,050051
摘    要:键合工序是半导体器件生产中的关键工序,采用统计过程控制(SPC)技术对关键工序进行监控是保持生产线稳定、减少质量波动的有力工具,可以提高产品的成品率和可靠性。在现有工序状态下采集键合拉力数据,计算和分析键合工序的工序能力指数,进行工艺调整和改进,直到工序能力指数Cpk≥1.33。选择计量控制图,对键合拉力数值进行监控,发现工序失控时,分析原因并及时采取纠正预防措施,保证工艺的一致性和稳定性,提高工艺成品率。

关 键 词:统计过程控制技术  键合  工序能力指数  控制图

Application of Statistic Process Control Technology in Bonding Process
Cui Bo.Application of Statistic Process Control Technology in Bonding Process[J].Semiconductor Technology,2009,34(8).
Authors:Cui Bo
Affiliation:The 13th Research Institute;CETC;Shijiazhuang 050051;China
Abstract:Wire bonding is a key process in semiconductor manufacture process, adopting statistic process control (SPC) technology to monitor the key process, it is a useful tool to keep the stability of the manufacture line, reduce the quality volatility. It can improve the yield and reliability of the devices. First sampling the bonding strength data at the current condition, calculate and analysis the process capability index, provide process adjustis and improvement, till the Cpk≥1.33. Choose the quantity control chart, monitoring the bonding strength value, when finding the process get out of hand, analying the reasons and taking timely corrective and preventive action, ensure process consistency and stability, improve the process yield.
Keywords:statistic process control (SPC) technology  wire bonding  process capability index  control chartEEACC: 2550F
本文献已被 CNKI 万方数据 等数据库收录!
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司  京ICP备09084417号