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Resistive Memory Switching of $hbox{Cu}_{x}hbox{O}$ Films for a Nonvolatile Memory Application
Authors:Lv   H.B. Yin   M. Fu   X.F. Song   Y.L. Tang   L. Zhou   P. Zhao   C.H. Tang   T.A. Chen   B.A. Lin   Y.Y.
Affiliation:Fudan Univ., Shanghai;
Abstract:Poly crystalline CuxO films produced by plasma oxidation are investigated for nonvolatile memory applications. Reversible bistable resistive switching from a high-resistance state to a low-resistance state, and vice versa, is observed in an integrated Al/CuxO/Cu structure under voltage sweeping. More than 3000 repetitive cycles are observed in 180-mum memory devices with an on/off ratio of ten times. Data testing shows that the devices meet the ten-year retention requirement for the storage of programmed logic signals.
Keywords:
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