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A vertical submicron polysilicon thin-film transistor using a lowtemperature process
Authors:Tiemin Zhao Min Cao Saraswat  KC Plummer  JD
Affiliation:Center for Integrated Syst., Stanford Univ., CA ;
Abstract:This letter presents a submicron (0.5 μ) vertical N-channel MOS thin-film transistor (TFT) fabricated in Polycrystalline Si using a simple low temperature process (⩽600°C). The channel length is determined by the thickness of an SiO2 film. As a result, submicron vertical polysilicon TFT's can be fabricated without submicron lithographic equipment that is not yet available for large area active matrix liquid crystal display (AMLCD) applications. The device has a dynamic range of greater than five orders of magnitude after hydrogenation
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