| 边界扫描测试技术 |
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| 引用本文： | 王孜,刘洪民,吴德馨.边界扫描测试技术[J].半导体技术,2002,27(9):17-20,29. |
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| 作者姓名： | 王孜 刘洪民 吴德馨 |
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| 作者单位： | 中国科学院微电子中心,北京,100029 |
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| 摘 要： | 边界扫描技术是一种标准化的可测试性设计方法,它提供了对电路板上元件的功能、互连及相互间影响进行测试的一种新方案,极大地方便了系统电路的测试.介绍了边界扫描技术的原理、结构,讨论了边界扫描技术的应用.
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| 关 键 词： | 边界扫描 边界扫描测试技术 印刷电路板 |
| 文章编号： | 1003-353X(2002)09-0017-04 |
Boundary-scan test technology |
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| WANG Zi,LIU Hong-ming,WU De-xin.Boundary-scan test technology[J].Semiconductor Technology,2002,27(9):17-20,29. |
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| Authors: | WANG Zi LIU Hong-ming WU De-xin |
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| Abstract: | Boundary scan technology is an integrated and standardized method to the problem of test. It provides a solution to the test of component-functionality, board interconnection and interaction, which facilitates the debugging of system circuitry. In the essay the theory and architecture of BST will be introduced, then its application will be discussed. |
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| Keywords: | boundary scan boundary-scan register PCB |
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