逻辑内建自测试技术进展综述

逻辑内建自测试(logic buit-in self-test,LBIST)是一种可测试性设计技术，利用芯片、板级或系统上的部分电路测试数字逻辑电路本身。LBIST对于许多应用来说至关重要，尤其是国防、航空航天、自动驾驶等生命和任务关键型的应用。这些应用需要执行片上、板上或系统内自检，以提高整个系统的可靠性及执行远程诊断的能力。该文首先给出了常用的LBIST分类，并描述了经典的，也是工业界应用最成功的LBIST架构——使用多输入特征寄存器和并行移位序列产生器的自测试架构；其次，对国内外研究团队、研究进展进行了总结；再次，详细剖析了LBIST的基本原理、时序控制、确定性自测试设计、低功耗设计、“X”容忍等关键技术点，列举出了主流的LBIST商业工具，并逐一分析了其软件架构和技术特点；最后，讨论当前LBIST技术仍需进一步解决的问题，并进行展望。

Overview of the Development of Logic Built-in Self-Test Technology

Logic buit-in self-test (LBIST) is a technique in design for testability (DFT) that utilizes components of a circuit within a chip, board, or system to conduct self-testing of the digital logic circuit. LBIST plays a critical role in various applications, particularly those that are vital for life and mission, such as defense, aerospace, and autopilot systems. These applications necessitate the implementation of on-chip, on-board, or in-system selfchecks to enhance the overall system reliability and enable remote diagnostics. This article first presents the commonly used LBIST classifications and describes the classic and most successful LBIST architecture used in the industry, self-testing using MISR and parallel SRSG (STUMPS). Then, it summarizes the research teams and research progress at home and abroad. Then, it analyzes in detail the key technical points of LBIST such as the basic principle, timing control, deterministic self-test design, low-power design, X tolerance, and lists mainstream LBIST business tools, the software architecture and technical characteristics of LBIST are analyzed one by one. Finally, the problems that need to be further solved in current LBIST technology are discussed and prospects are made.